BL No. Access Mode Proposal No. Category of Review field Title of Experiment Principal Investigater Affiliation Adopted BT
BL04PU2009A0010--Measurements of nuclear data of minor actinides and long lived fission products for advanced nuclear systemsYoshiaki KiyanagiHokkaido University4
BL05S-type2009S03--Fundamental Physics with Pulsed Cold NeutronsHirohiko ShimizuHigh Energy Accelerator Research Organization 
BL10IU2009A0058--Study on Neutronic Performance of JSNSFujio MaekawaJapan Atomic Energy Agency6
BL10PU2009A0081--Research and Development of energy selective neutron imaging techniqueMasahito MatsubayashiJapan Atomic Energy Agency8
BL10PU2009A0083--Development and Application of Neutron Optical and Detection SystemsJun-ichi SuzukiJapan Atomic Energy Agency4
BL10PU2009A0084--Prompt Gamma-ray Analysis on NOBORUYoshimi KasugaiJapan Atomic Energy Agency 
BL10GU2009A0027P5Magnetism and Strongly Correlated Electron SystemsHigh Magnetic Field Neutron Diffractions in Frustrated Multi-ferroicsHiroyuki NOJIRITohoku University6
BL10GU2009A0017P6Fundamental Physics, Nuclear Science and Instrument R&DExperimental test of TOF-MIEZE spectrometerMasahiro HinoKyoto University6
BL10GU2009A0024P6Fundamental Physics, Nuclear Science and Instrument R&DExperimental study on a calibration method of devices for neutrons from thermal to several 100 MeV using a spallation neutron sourceTetsuro MatsumotoNational Institute of Advanced Industrial Science and Technology1
BL10GU2009A0046P6Fundamental Physics, Nuclear Science and Instrument R&DDevelopment of neutron scintillator monitor detectorTatsuya NakamuraJapan Atomic Energy Agency3
BL10GU2009A0065P6Fundamental Physics, Nuclear Science and Instrument R&DDevelopment of neutron beam focusing devices using large-m supermirror on precisely figured aspheric surfacesDai YamazakiJapan Atomic Energy Agency2
BL10GU2009A0069P6Fundamental Physics, Nuclear Science and Instrument R&DNeutron micrometer-scale imaging detector using electronic zooming tubeKazuhiko SoyamaJapan Atomic Energy Agency1
BL10GU2009A0078P7Industrial Applications半導体素子のシングルイベント耐性試験に係る白色中性子場のフィージビリティ評価浅井 弘彰HIREC Corporation2